Compact Spectrometer for X-rays

The present invention relates generally to x-ray spectroscopy and, more particularly, to an apparatus for focusing a von Hamos type crystal x-ray spectrometer, and a method for operation of same. Background: An x-ray spectrometer is an optical device used to resolve and select different x-ray photon energies. The x-ray spectrometer operates by using a diffractive crystal. A von Hamos x-ray spectrometer includes an x-ray source defined by a rectangular slit, a cylindrically bent crystal, and a position sensitive detector located on a crystal axis of curvature. The von Hamos geometry permits the spectrometer to collect data over an energy bandwidth. Different crystals are used at different angular specifications to allow the spectrometer to observe x-rays. Technology Overview: The spectrometer focusing apparatus incorporates a hollow cylinder for x-rays to traverse a length thereof, a defracting element configured as a ring on an interior circumference of a portion forming a hollow cylinder. To resolve the drawbacks and disadvantages of current conventional systems, the apparatus and provides a portable device that uses only an apparatus formed along a perimeter of a disk to limit an angle of incidence One disk edge is utilized as a defining circle aligned with the defracting element, causing an aperture to be formed between the defracting element and the edge of the one disk. Advantages: A smaller size allows for a versatile and portable approach of x ray designs. A small cost has allowed an affordable accessory to spectroscopy and imaging facilities. New spectrometer works with simple counting or solid state detectors. Applications: Device enhancing and improving existing instruments and facilities as an accessory for standard X-ray detectors. Intellectual Property Summary: Stage of Development: Licensing Potential: We seek to develop and commercialize, by an exclusive or non-exclusive license agreement and/or sponsored research, with a company active in the area. Licensing Status: Available for License Additional Information: x-ray spectormeter, diffraction, energy resolution, x-ray fluorescence , , , ,
Patent Information:
Technology/Start-up ID: