Technology - Periodic Thermoreflectance Layer-by-Layer Non-Destructive Testing

Periodic Thermoreflectance Layer-by-Layer Non-Destructive Testing

 Non-invasive monitoring of in-situ printing uses thermal waves to detect defects that can be easily reworked during production

 Technology Overview:

 Herein, this invention disclosure relates to a method to non-invasively monitor printing in-situ. This technique has the ability to monitor a few layers into the material, in a manner that can differentiate between different defect types. This is achieved by utilizing thermal waves to measure the properties during print a few layers below the surface, and reconstruct the characteristic of the layers immediately below. This allows for defects to be easily detected and reworked during production.


  • Unlike ultrasounds, a transducer does not need to touch the surface.
  • Unlike X-Ray/CT-scanners, technique can be done during build to correct any manufacturing defects before completion.
  • X-Ray/CT scanners are extremely expensive and unlikely to be integrated into printers. 

Patent Information: