Periodic Thermoreflectance Layer-by-Layer Non-Destructive Testing
Non-invasive monitoring of in-situ printing uses thermal waves to detect defects that can be easily reworked during production
Herein, this invention disclosure relates to a method to non-invasively monitor printing in-situ. This technique has the ability to monitor a few layers into the material, in a manner that can differentiate between different defect types. This is achieved by utilizing thermal waves to measure the properties during print a few layers below the surface, and reconstruct the characteristic of the layers immediately below. This allows for defects to be easily detected and reworked during production.
https://www.pexels.com/photo/close-up-photo-of-a-digital-image-7088489/
- Unlike ultrasounds, a transducer does not need to touch the surface.
- Unlike X-Ray/CT-scanners, technique can be done during build to correct any manufacturing defects before completion.
- X-Ray/CT scanners are extremely expensive and unlikely to be integrated into printers.
Patent Information:
App Type |
Country |
Serial No. |
Patent No. |
Patent Status |
File Date |
Issued Date |
Expire Date |
|